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Hollow-cone Dark Field (HCDF) Imaging for Nano-grained Mg: Experimental and Simulated Contrast

Published online by Cambridge University Press:  22 July 2022

Yushun Liu  and
Guozhen Zhu
Yushun Liu
Affiliation:
Department of Mechanical Engineering and Manitoba Institute for Materials, University of Manitoba, Winnipeg, MB, R3T 5V6, Canada
Guozhen Zhu*
Affiliation:
Department of Mechanical Engineering and Manitoba Institute for Materials, University of Manitoba, Winnipeg, MB, R3T 5V6, Canada
*
*Corresponding author: [email protected]

Abstract

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Type
On Demand - Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 340 - 343
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Copyright
Copyright © Microscopy Society of America 2022

References

Zhang, H. et al. , Journal of Materials Research and Technology 9(2020), p. 14742-14753. doi: 10.1016/j.jmrt.2020.10.041CrossRefGoogle Scholar
Yang, X. H. et al. , Materials Science and Engineering A 658(2016), p. 16-27. doi: 10.1016/j.msea.2016.01.080CrossRefGoogle Scholar
Hu, J. et al. , Philosophical Magazine 100(2020), p. 1454-1475. doi: 10.1080/14786435.2020.1725250CrossRefGoogle Scholar
Morawiec, A., Bouzy, E. and Fundenberger, J. J., Ultramicroscopy 136(2014), p. 107-118. doi: 10.1016/j.ultramic.2013.08.008CrossRefGoogle Scholar
Yao, B. et al. , Micron 42(2011), p. 29-35. doi: 10.1016/j.micron.2010.08.010CrossRefGoogle Scholar
Kirkland, E. J. in “Advanced Computing in Electron Microscopy”, ed. 3, (Plenum Press, New York).Google Scholar
Wang, L. H. et al. , Applied Physics Letters 98(2011), p. 051905. doi: 10.1063/1.3549866CrossRefGoogle Scholar