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History and Cross-Disciplinary Perspective of Compositional Imaging and Mapping With Nexafs Microscopy

Published online by Cambridge University Press:  02 July 2020

H. Ade*
Affiliation:
Department of Physics, North Carolina State University, Raleigh, NC, 27695
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In Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy, excitations of core electrons into unoccupied molecular orbitals or electronic states provide sensitivity to a wide variety of chemical functionalities in molecules and solids. This sensitivity complements infrared (IR) spectroscopy, although the NEXAFS spectra are not quite as specific and “rich” as IR spectra. The sensitivity of NEXAFS to distinguish chemical bonds and electronic structures covers a wide variety of samples: from metals to inorganics and organics. (There is a tendency in the community to use the term NEXAFS for soft x-ray spectroscopy of organic materials, while for inorganic materials or at higher energies X-ray Absorption Near Edge Spectroscopy (XANES) is utilized, even though the fundamental physics is the same.) The sensitivity of NEXAFS is particularly high to distinguish saturated from unsaturated bonds. NEXAFS can also detect conjugation in a molecule, as well as chemical shifts due to heteroatoms.

Type
Compositional Mapping With High Spatial Resolution
Copyright
Copyright © Microscopy Society of America

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References

1.Stöhr, J., NEXAFS Spectroscopy (Springer-Verlag, Berlin, 1992).CrossRefGoogle Scholar
2.Urquhart, S.G., Hitchcock, A.P., Smith, A.P., Ade, H. and Rightor, E.G., J. Phys. Chem. B 101, 22672276 (1997).CrossRefGoogle Scholar
3.Ade, H., et al., Mater. Res. Soc. Symp. Proc. 437, 99 (1996).CrossRefGoogle Scholar
4.Egerton, R.F., Electron Energy Loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1986).Google Scholar
5.Rightor, E.G., et al., J. Phys. Chem. B 101, 19501961 (1997).CrossRefGoogle Scholar
6.Jacobsen, C., et al., Opt. Commun. 86, 351 (1991).CrossRefGoogle Scholar
7.Tonner, B.P. and Harp, G.R., J. Vac. Sci. Technol. 7, 14 (1989).CrossRefGoogle Scholar
8.Harp, G.R., Han, Z.L. and Tonner, B.P., J. Vac. Sci. Technol. 8, 2566 (1990).CrossRefGoogle Scholar
9.Ade, H., et al., Science 258, 972 (1992).CrossRefGoogle Scholar
10.Zhang, X., et al., Nucl. Instrum. Meth. in Phys. Res. A347, 431435 (1994).CrossRefGoogle Scholar
11.Ade, H. and Hsiao, B., Science 262, 1427 (1993).CrossRefGoogle Scholar
12.Smith, A.P. and Ade, H., Appl. Phys. Lett. 69, 3833 (1996).Google Scholar
13.Zhang, X., Balhorn, R., Mazrimas, J. and Kirz, J., J. Struc. Biol. 116, 335344 (1996).CrossRefGoogle Scholar
14.Warwick, T., et al., J. Electron Spectrosc. Relat. Phenom. 84, 8598 (1997).CrossRefGoogle Scholar
15.Botto, R.E., et al., Energy & Fuels 8, 151154 (1994).CrossRefGoogle Scholar
16.Cody, G.D., et al., Energy & Fuels 9, 525533 (1995).CrossRefGoogle Scholar
17.Cody, G.D., Ade, H., Wirick, S., Mitchell, G.D. and Davis, A., Geochimica and Cosmochimica Acta (1997).Google Scholar
18.Cody, G.D., Botto, R.E., Ade, H. and Wirick, S., Int. J. Coal Geol. 32, 6986 (1996).CrossRefGoogle Scholar
19.Ade, H., et al., (in preparation).Google Scholar
20.Winesett, A.D., et al., these proceeding (1998).Google Scholar
21.Boese, J., Osanna, A., Jacobsen, C. and Kirz, J., J. Electron Spectrosc. Relat. Phenom. 85, 9 (1997).CrossRefGoogle Scholar
22.Ade, H., et al., J. Electron Spectrosc. Relat. Phenom. 84, 5372 (1997).CrossRefGoogle Scholar
23.Smith, A.P., Coffey, T. and Ade, H., in X-ray Microscopy and Spectromicroscopy eds. Thieme, J., Schmahl, G., Umbach, E. and Rudolph, D. (Springer Verlag, Berlin, 1997).Google Scholar
24.Cossy-Favre, A., et al., Acta Phys. Polonica A 91 (1997).Google Scholar
25.De Stasio, G., et al., J. Synchrotron Rad. 2, 106112 (1995).CrossRefGoogle Scholar