Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T11:42:42.417Z Has data issue: false hasContentIssue false
  • English
  • Français

HIM-SIMS: Correlative SE/Chemical Imaging at the Limits of Resolution.

Published online by Cambridge University Press:  04 August 2017

D. Dowsett ,
T. Wirtz  and
L. Yedra
D. Dowsett
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
T. Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
L. Yedra
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 278 - 279
Copyright
© Microscopy Society of America 2017 

References

[1] Scipioni, L., et al, J. Vac. Sci. Technol. B 27 2009 3250.Google Scholar
[2] Hlawacek, G., Veligura, V., Van Gastel, R. & Poelsema, B. J. Vac. Sci. Technol. B 32 2014 020801.CrossRefGoogle Scholar
[3] Klingner, N., Heller, R., Hlawacek, G., von Borany, J., Notte, J., Uang, J. & Facsko, S. Ultramicroscopy 162 2016 91–97.Google Scholar
[4] Wirtz, T., Vanhove, N., Pillatsch, L., Dowsett, D., Sijbrandij, S. & Notte, J. Appl. Phys. Lett 101(4 2012 041601-1-041601–5.Google Scholar
[5] Pillatsch, L., Vanhove, N., Dowsett, D., Sijbrandij, S., Notte, J. & Wirtz, T. Appl. Surf. Sci 282 2013 908–913.CrossRefGoogle Scholar
[6] Wirtz, T., Dowsett, D. & Philipp, P. Helium Ion Microscopy (edited by G. Hlawacek & A. GolzhauserSpringer 2016.Google Scholar
[7] Gratia, P., Grancini, G., Audinot, J.-N., Jeanbourquin, X., Mosconi, E., Zimmermann, I., Dowsett, D., Lee, Y., Gratzel, M.l, De Angelis, F., Sivula, K., Wirtz, T. & Nazeeruddin, M. K. J. Am. Chem. Soc 138(49 2016 15821–15824.CrossRefGoogle Scholar
[8] Wirtz, T., Philipp, P., Audinot, J.-N., Dowsett, D. & Eswara, S. Nanotechnology 26 2015 434001.Google Scholar