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Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Kruit, P. and Zuidema, W., “A Dedicated Multi-Beam SEM for Transmission Imaging of Thin Samples,” Microsc. Microanal., vol. 25, no. S2, pp. 1034–1035, 2019.10.1017/S1431927619005907CrossRefGoogle Scholar
[2]
Ren, Y. and Kruit, P., “Transmission electron imaging in the Delft multibeam scanning electron microscope 1,” J. Vac. Sci. Technol. B, Nanotechnol. Microelectron. Mater. Process. Meas. Phenom., vol. 34, no. 6, p. 06KF02, 2016.Google Scholar
[3]
Zuidema, W. and Kruit, P., “Transmission imaging on a scintillator in a scanning electron microscope,” Ultramicroscopy, vol. 218, p. 113055, 2020.Google Scholar
de Boer, P. et al. , “Large-scale electron microscopy database for human type 1 diabetes,” Nat. Commun., vol. 11, no. 1, pp. 1–9, 2020.10.1038/s41467-020-16287-5CrossRefGoogle ScholarPubMed