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High-speed and Large Field-of-view Imaging via X-ray Fly-scan Ptychography

Published online by Cambridge University Press:  05 August 2019

Yi Jiang ,
Junjing Deng ,
Jeffrey A. Klug ,
Yudong Yao ,
Curt Preissner ,
Christian Roehrig ,
Zhonghou Cai ,
Barry Lai  and
Stefan Vogt
Yi Jiang*
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Junjing Deng
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Jeffrey A. Klug
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Yudong Yao
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Curt Preissner
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Christian Roehrig
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Zhonghou Cai
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Barry Lai
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
Stefan Vogt
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 46 - 47
Copyright
Copyright © Microscopy Society of America 2019 

References

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[9]This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. Eupholus geoffroyi beetle sample provided by Anatoly Shabalin (University of California San Diego).Google Scholar