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High-Resolution TEM Analysis of Supported Metal Nanoparticles Combining with Image Simulation

Published online by Cambridge University Press:  09 October 2013

B. Zhang
Affiliation:
W. Zhang
Affiliation:
L. Shao
Affiliation:
D.S. Su
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013