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High-Resolution Phase-Contrast Imaging at XFELs

Published online by Cambridge University Press:  23 September 2015

A. Schropp
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany
R. Hoppe
Affiliation:
Technische Universitat Dresden, Germany
V. Meier
Affiliation:
Technische Universitat Dresden, Germany
J. Patommel
Affiliation:
Technische Universitat Dresden, Germany
F. Seiboth
Affiliation:
Technische Universitat Dresden, Germany
Hae Ja Lee
Affiliation:
SLAC National Accelerator Laboratory, USA
B. Nagler
Affiliation:
SLAC National Accelerator Laboratory, USA
E.C Galti er
Affiliation:
SLAC National Accelerator Laboratory, USA
B. Arnol d
Affiliation:
SLAC National Accelerator Laboratory, USA
J.B. Hastings
Affiliation:
SLAC National Accelerator Laboratory, USA
C.G.S chroer
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Schropp, A., et al., Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging. Scientific Reports 3, 1633 (2013).Google Scholar
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