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High-Resolution Full-Field X-ray Microscope for 20-keV X-rays with Multilayer Imaging Mirrors

Published online by Cambridge University Press:  10 August 2018

Satoshi Matsuyama ,
Jumpei Yamada ,
Kentaro Hata ,
Yoshiki Kohmura ,
Makina Yabashi ,
Tetsuya Ishikawa  and
Kazuto Yamauchi
Satoshi Matsuyama*
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Jumpei Yamada
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Kentaro Hata
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Yoshiki Kohmura
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan
Makina Yabashi
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan
Tetsuya Ishikawa
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan
Kazuto Yamauchi
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
*
*Corresponding author, [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 284 - 285
Copyright
© Microscopy Society of America 2018 

References

[1] Matsuyama, S., et al, Sci. Rep. 7, 46358 2017.CrossRefGoogle Scholar
[2] Kim, J., et al, Opt. Express 23, 29032 2015.Google Scholar
[3] Yamada, J., et al, Appl. Opt. 56, 967 2017.Google Scholar