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High-resolution electron imaging of amorphous layers with aberration-corrected probes

Published online by Cambridge University Press:  03 August 2008

S Maccagnano-Zacher ,
A Mkhoyan  and
J Silcox
S Maccagnano-Zacher
Affiliation:
Cornell University
A Mkhoyan
Affiliation:
Cornell University
J Silcox
Affiliation:
Cornell University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 940 - 941
Copyright
© 2008 Microscopy Society of America

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