Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-28T17:27:38.352Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution Electron Diffraction of Protein Crystals in Their Liquid Environment at Room Temperature Using a Direct Electron Detection Camera

Published online by Cambridge University Press:  22 July 2022

Sergi Plana-Ruiz ,
Wai Li Ling ,
Dominique Housset ,
César Santiago ,
Diana Peckys ,
Jaime Martín-Benito ,
Alejandro Gómez-Pérez ,
Partha Pratim Das  and
Stavros Nicolopoulos
Sergi Plana-Ruiz*
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium Servei de Recursos Científics i Tècnics, Universitat Rovira i Virgili, Tarragona 43007, Spain
Wai Li Ling
Affiliation:
Université Grenoble Alpes, CEA, CNRS, IBS, Grenoble 38000, France
Dominique Housset
Affiliation:
Université Grenoble Alpes, CEA, CNRS, IBS, Grenoble 38000, France
César Santiago
Affiliation:
Centro Nacional de Biotecnología, Madrid 28049, Spain
Diana Peckys
Affiliation:
Clinic of Operative Dentistry, Periodontology and Preventive Dentistry, University Hospital, Saarland University, Homburg/Saar 66421, Germany
Jaime Martín-Benito
Affiliation:
Centro Nacional de Biotecnología, Madrid 28049, Spain
Alejandro Gómez-Pérez
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium
Partha Pratim Das
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium
Stavros Nicolopoulos*
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium
*
*Corresponding author: [email protected]; [email protected]
*Corresponding author: [email protected]; [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2246 - 2249
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Henderson, R. and Unwin, P.N.T., Nature 257 (1975), p. 28-32. doi:10.1038/257028a0Google Scholar
Frank, J., Ultramicroscopy 1 (1975), p. 159-162. doi:10.1016/S0304-3991(75)80020-9CrossRefGoogle Scholar
Dubochet, J. and McDowall, A.w., Journal of Microscopy 124 (1981), p. 3-4. doi:10.1111/j.1365-2818.1981.tb02483.xCrossRefGoogle Scholar
Marchello, G. et al. , ArXiv (2019). url: http://arxiv.org/abs/1907.03348Google Scholar
Peckys, D.B., Macías-Sánchez, E. and de Jonge, N., MRS Bulletin 45 (2020), p. 754–760. doi:10.1557/mrs.2020.225.CrossRefGoogle Scholar
Keskin, S. and de Jonge, N., Microscopy and Microanalysis 27 (2021), p. 2902–2903. doi:10.1017/S1431927621010126.CrossRefGoogle Scholar
Bücker, R., Pascal, H.-L. and Dwayne, R.J., Frontiers in Molecular Biosciences 8 (2021), p. 415. doi: 10.3389/fmolb.2021.624264.CrossRefGoogle Scholar
The authors acknowledge the opportunity to use the TEM facilities of Prof. Ute Kolb in the Technische Universität Darmstadt, Germany, and Dr. Edgar Rauch in the CNRS-Grenoble, France, to test some ideas of the presented work. We also acknowledge the IBS/ISBG electron microscopy platform where this work was performed. IBS acknowledges integration into the Interdisciplinary Research Institute of Grenoble (IRIG, CEA).Google Scholar