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High-Resolution Cathodoluminescence Investigation of Degradation Processes in InGaN Green Laser Diodes

Published online by Cambridge University Press:  25 July 2016

David Gachet ,
Carlo de Santi ,
Matteo Meneghini ,
Giovanna Mura ,
Massimo Vanzi ,
Gaudenzio Meneghesso  and
Enrico Zanoni
David Gachet
Affiliation:
Attolight AG, EPFL Innovation Park, Building D, CH-1015 Lausanne, Switzerland
Carlo de Santi
Affiliation:
Department of Information Engineering, University of Padova, Padova, Italy
Matteo Meneghini
Affiliation:
Department of Information Engineering, University of Padova, Padova, Italy
Giovanna Mura
Affiliation:
Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy
Massimo Vanzi
Affiliation:
Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy
Gaudenzio Meneghesso
Affiliation:
Department of Information Engineering, University of Padova, Padova, Italy
Enrico Zanoni
Affiliation:
Department of Information Engineering, University of Padova, Padova, Italy

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1738 - 1739
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Nakamura, , et al, Jpn J. Appl. Phys 34 (1995). p. L797.CrossRefGoogle Scholar
[2] Marioli, , et al, Physica Status Solidi A 212 (2015). p. 974.CrossRefGoogle Scholar
[3] Reimer, L. in Scanning Electron Microscopy. (Springer, Berlin) Ch. 1.Google Scholar
[4] The authors acknowledge Michael Marioli for performing part of the stress tests.Google Scholar