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High-Performance Compact Pre-Lens Retarding Field Energy Analyzer for Energy Distribution Measurements of an Electron Gun

Published online by Cambridge University Press:  05 September 2022

Ha Rim Lee
Affiliation:
Scientific Instruments Performance Evaluation Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea
Junhyeok Hwang
Affiliation:
Scientific Instruments Performance Evaluation Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea Major in Nanoconvergence Measurement, University of Science and Technology, 217 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea
Takashi Ogawa
Affiliation:
Scientific Instruments Performance Evaluation Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea Major in Nanoconvergence Measurement, University of Science and Technology, 217 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea
Haewon Jung
Affiliation:
Scientific Instruments Performance Evaluation Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea
Dal-Jae Yun
Affiliation:
Scientific Instruments Performance Evaluation Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea
Sangsun Lee
Affiliation:
Quantum Spin Team, Quantum Technology Institue, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea
In-Yong Park*
Affiliation:
Scientific Instruments Performance Evaluation Team, Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea Major in Nanoconvergence Measurement, University of Science and Technology, 217 Gajeong-ro, Yuseong-gu, Daejeon 34113, South Korea
*
*Corresponding author: In-Yong Park, E-mail: [email protected]
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Abstract

The energy distribution of an electron gun is one of the most important characteristics determining the performance of electron beam-based instruments, such as electron microscopes and electron energy loss spectroscopes. For accurate measurements of the energy distribution, this study presents a novel retarding field energy analyzer (RFEA) with the feature of an additional integrated pre-lens, which enables an adjustment of beam trajectory into the analyzer. The advantages of this analyzer are its compact size and simple electrode configuration. According to trajectory simulation theories, the optimum condition arises when the incident electron beam inside the RFEA is focused on the center of a retarding electrode. Comparing IV curves depending on whether the pre-lens working or not, it is confirmed that the use of the pre-lens dramatically improves the energy resolution and efficiency of the signal acquisition process. The pre-lens RFEA was applied to characterize a Schottky electron gun under various temperatures and extraction voltages as operational conditions. When the tip temperature was increased by 50 K, we were able to measure an energy distribution broadening of 13.8 meV with the proposed pre-lens RFEA. The relative standard deviation of energy distribution was 0.7% for each working condition.

Type
Software and Instrumentation
Copyright
Copyright © The Author(s), 2022. Published by Cambridge University Press on behalf of the Microscopy Society of America

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References

Adachi, H, Sase, M, Zaima, S & Shibata, Y (1981). Performance computations for a high-resolution retarding field electron energy analyser with a simple electrode configuration. J Phys D: Appl Phys 14, 769778.CrossRefGoogle Scholar
Baloniak, T, Reuter, R, Flötgen, C & Von Keudell, A (2010). Calibration of a miniaturized retarding field analyzer for low-temperature plasmas: Geometrical transparency and collisional effects. J Phys D: Appl Phys 43, 055203.CrossRefGoogle Scholar
Bell, AE & Swanson, LW (1979). Total energy distributions of field-emitted electrons at high current density. Phys Rev B 19, 33533364.CrossRefGoogle Scholar
Bronsgeest, MS, Barth, JE, Schwind, GA, Swanson, LW & Kruit, P (2007). Extracting the Boersch effect contribution from experimental energy spread measurements for Schottky electron emitters. J Vac Sci Technol B: Microelectron Nanometer Struct 25, 2049.CrossRefGoogle Scholar
Cavenago, M, Bellan, L & Comunian, M (2018). Analysis of grid size and ion temperature effects in retarding field energy analyzers (RFEA). AIP Adv 8. doi:10.1063/1.5048360.CrossRefGoogle Scholar
El-Kareh, AB, Wolfe, JC & Wolfe, JE (1977). Contribution to the general analysis of field emission. J Appl Phys 48, 47494753.CrossRefGoogle Scholar
Emitter, F (2007). Characteristics of Transmission-type Microfocus X-ray Tube based-on Carbon Nanotube Field Emitter, 10–11.Google Scholar
Enloe, CL, Amatucci, WE, McHarg, MG & Balthazor, RL (2015). Screens versus microarrays for ruggedized retarding potential analyzers. Rev Sci Instrum 86, 17. doi:10.1063/1.4929532CrossRefGoogle ScholarPubMed
Fanelli, L, Noel, S, Earle, GD, Fish, C, Davidson, RL, Robertson, RV, Marquis, P, Garg, V, Somasundaram, N, Kordella, L & Kennedy, P (2015). A versatile retarding potential analyzer for nano-satellite platforms. Rev Sci Instrum 86, 124501.CrossRefGoogle ScholarPubMed
Fransen, MJ (1998). Experimental evaluation of the extended Schottky model for ZrO/W electron emission. J Vac Sci Technol B: Microelectron Nanometer Struct 16, 2063.CrossRefGoogle Scholar
Hwang, J, Kim, KI, Ogawa, T, Cho, B, Kim, DH & Park, IY (2020). Study and design of a lens-type retarding field energy analyzer without a grid electrode. Ultramicroscopy 209, 112880. doi:10.1016/j.ultramic.2019.112880.CrossRefGoogle ScholarPubMed
Johnson, SD, El-Gomati, MM & Enloe, L (2003). High-resolution retarding field analyzer. J Vac Sci Technol B: Microelectron Nanometer Struct 21, 350.CrossRefGoogle Scholar
Kim, HS, Yu, ML, Thomson, MGR, Kratschmer, E & Chang, THP (1997). Energy distributions of Zr/O/W Schottky electron emission. J Appl Phys 81, 461465.CrossRefGoogle Scholar
Kim, KI, Hwang, J, Pin, MW, Kwon, J, Lee, HR & Park, IY (2021). Creation and characterization of an atomically sharp single/trimer atom Ir/W(111) tip by thermal field-assisted faceting. Microsc Microanal 27, 10171025.CrossRefGoogle Scholar
Landheer, K, Kobelev, AA, Smirnov, AS, Bosman, J, Deelen, S, Rossewij, M, De Waal, AC, Poulios, I, Benschop, AF, Schropp, REI & Rath, JK (2017). Note: Laser-cut molybdenum grids for a retarding field energy analyzer. Rev Sci Instrum 88, 14.CrossRefGoogle ScholarPubMed
Lencová, B & Zlámal, J (2008). A new program for the design of electron microscopes. Phys Procedia 1, 315324. doi:10.1016/j.phpro.2008.07.111CrossRefGoogle Scholar
Mankos, M, Shadman, K & Kolarik, V (2016). Novel electron monochromator for high resolution imaging and spectroscopy. J Vac Sci Technol B: Nanotechnol Microelectron: Mater Process Meas Phenom 34, 06KP01. doi:10.1116/1.4962383.Google Scholar
Matsuda, H, Tóth, L & Daimon, H (2018). Variable-deceleration-ratio wide-acceptance-angle electrostatic lens for two-dimensional angular and energy analysis. Rev Sci Instrum 89, 123105.CrossRefGoogle ScholarPubMed
McClelland, JJ, Ratliff, JM & Fink, M (1981). Measurements and calculations of the anomalous energy broadening of a 300-eV electron beam. J Appl Phys 52, 70397043.CrossRefGoogle Scholar
Muro, T, Ohkochi, T, Kato, Y, Izumi, Y, Fukami, S, Fujiwara, H & Matsushita, T (2017). Wide-angle display-type retarding field analyzer with high energy and angular resolutions. Rev Sci Instrum 88, 123106.CrossRefGoogle ScholarPubMed
Ogawa, T & Takai, Y (2018). Evaluation of electron optics with an offset cylindrical lens: Application to a monochromator or energy analyzer. J Vac Sci Technol B 36, 032902.CrossRefGoogle Scholar
Schwind, GA, Magera, G & Swanson, LW (2006). Comparison of parameters for Schottky and cold field emission sources. J Vac Sci Technol B: Microelectron Nanometer Struct 24, 2897.CrossRefGoogle Scholar
Sharma, S, Gahan, D, Scullin, P, Daniels, S & Hopkins, MB (2015). Ion angle distribution measurement with a planar retarding field analyzer. Rev Sci Instrum 86, 17. doi:10.1063/1.4934808CrossRefGoogle ScholarPubMed
Tee, BPE, Stuchbery, AE, Vos, M, Dowie, JTH, Lee, BQ, Alotiby, M, Greguric, I & Kibédi, T (2019). High-resolution conversion electron spectroscopy of the i 125 electron-capture decay. Phys Rev C 100, 110.CrossRefGoogle Scholar
Van De Ven, THM, De Meijere, CA, Van Der Horst, RM, Van Kampen, M, Banine, VY & Beckers, J (2018). Analysis of retarding field energy analyzer transmission by simulation of ion trajectories. Rev Sci Instrum 89, 043501.CrossRefGoogle ScholarPubMed
Went, MR & Vos, M (2005). Electron-induced KLL auger electron spectroscopy of Fe, Cu and Ge. J Electron Spectrosc Relat Phenom 148, 107114.CrossRefGoogle Scholar
Young, RD (1959). Theoretical total-energy distribution of field-emitted electrons. Phys Rev 113, 110114.CrossRefGoogle Scholar
Young, RD & Kuyatt, CE (1968). Resolution determination in field emission energy analyzers. Rev Sci Instrum 39, 14771480.CrossRefGoogle Scholar
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