Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Lepinay, K.
and
Lorut, F.
2013.
Three-Dimensional Semiconductor Device Investigation Using Focused Ion Beam and Scanning Electron Microscopy Imaging (FIB/SEM Tomography).
Microscopy and Microanalysis,
Vol. 19,
Issue. 1,
p.
85.