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High Speed/Low Dose Analytical Electron Microscopy with Machine Learning and Multi-Objective Dynamic Sampling

Published online by Cambridge University Press:  01 August 2018

Karl A. Hujsak ,
Eric Roth ,
William Kellogg ,
Lawrence F. Drummy  and
Vinayak P. Dravid
Karl A. Hujsak
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL 60208
Eric Roth
Affiliation:
Electron Probe Instrumentation Center (EPIC) Facility, NUANCE Center, Northwestern University, Evanston, IL 60208
William Kellogg
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL 60208
Lawrence F. Drummy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, OH 45433
Vinayak P. Dravid
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL 60208 Electron Probe Instrumentation Center (EPIC) Facility, NUANCE Center, Northwestern University, Evanston, IL 60208

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1954 - 1955
Copyright
© Microscopy Society of America 2018 

References

[1] Spurgeon, S.R., Du, Y. Chambers, S.A. Microscopy and Microanalysis 23(no. 3 2017 513–517.Google Scholar
[2] Hujsak, K., Myers, B.D., Roth, E., Li, Y. Dravid, V. P. M&M 2016 1–11.Google Scholar
[3] Godaliyadda, G.M., Ye, D.H., Uchic, M.D., Groeber, M.A., Buzzard, G.T. Bouman, C.A.. Electronic Imaging 2016 no. 19 2016 1–8.Google Scholar
[4] This material is based on research sponsored by the Air Force Research laboratory under agreement No. FA8650-15-2-5518 and Air Force Office of Scientific Research under Award No. FA9550-12-1-0280. This work made use of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (TIN); the Keck Foundation; and the State of Illinois..Google Scholar