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High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA

Published online by Cambridge University Press:  23 November 2012

T. Murano ,
H. Takahashi ,
N. Handa ,
M. Terauchi ,
M. Koike ,
T. Kawachi ,
I. Takashi ,
N. Hasegawa ,
M. Koeda  and
T. Nagano
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T. Murano
Affiliation:
JEOL Ltd., Akishima, tokyo, Japan
H. Takahashi
Affiliation:
JEOL Ltd., Akishima, tokyo, Japan
N. Handa
Affiliation:
JEOL Ltd., Akishima, tokyo, Japan
M. Terauchi
Affiliation:
Institute for Multidisciplinary Research for Advanced Materials, Tohoku University,, Sendai, Miyagi, Japan
M. Koike
Affiliation:
Japan Atomic Energy Agency, Kizu, Kyoto, Japan
T. Kawachi
Affiliation:
Japan Atomic Energy Agency, Kizu, Kyoto, Japan
I. Takashi
Affiliation:
Japan Atomic Energy Agency, Kizu, Kyoto, Japan
N. Hasegawa
Affiliation:
Japan Atomic Energy Agency, Kizu, Kyoto, Japan
M. Koeda
Affiliation:
Customer & Optical Products Department, Shimadzu Corp., Kyoto, Kyoto, Japan
T. Nagano
Affiliation:
Customer & Optical Products Department, Shimadzu Corp., Kyoto, Kyoto, Japan
H. Sasai
Affiliation:
Customer & Optical Products Department, Shimadzu Corp., Kyoto, Kyoto, Japan
Y. Oue
Affiliation:
Customer & Optical Products Department, Shimadzu Corp., Kyoto, Kyoto, Japan
Z. Yonezawa
Affiliation:
Customer & Optical Products Department, Shimadzu Corp., Kyoto, Kyoto, Japan
S. Kuramoto
Affiliation:
Customer & Optical Products Department, Shimadzu Corp., Kyoto, Kyoto, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 776 - 777
Copyright
Copyright © Microscopy Society of America 2012

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