Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-28T04:43:00.567Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution X-ray Microscopy in the Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2004

Del Redfern ,
L A Brownlow ,
C J Sheffield-Parker ,
P R Miller  and
S. C. Mayo
Del Redfern
Affiliation:
EDAX , Mahrrah, New Jersey
L A Brownlow
Affiliation:
XRT, Australia
C J Sheffield-Parker
Affiliation:
XRT, Australia
P R Miller
Affiliation:
CSIRO Manufacturing and Infrastructure Technology, Australia
S. C. Mayo
Affiliation:
CSIRO Manufacturing and Infrastructure Technology, Australia
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 102 - 103
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)