Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-26T03:35:04.008Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  01 August 2010

H Inada ,
M Konno ,
Y Suzuki ,
K Nakamura ,
J Wall  and
Y Zhu
H Inada
Affiliation:
Hitachi High-Technologies Corp, Japan
M Konno
Affiliation:
Hitachi High-Technologies Corp, Japan
Y Suzuki
Affiliation:
Hitachi High-Technologies Corp, Japan
K Nakamura
Affiliation:
Hitachi High-Technologies Corp, Japan
J Wall
Affiliation:
Brookhaven National Laboratory
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 102 - 103
Copyright
Copyright © Microscopy Society of America 2010