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High Resolution Imaging with an Aberration Corrected JEOL 2200FS-AC STEM/TEM

Published online by Cambridge University Press:  01 August 2005

D A Blom ,
L F Allard ,
M A O'Keefe  and
S Mishina
D A Blom
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
L F Allard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
M A O'Keefe
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
S Mishina
Affiliation:
JEOL USA, Peabody, Massachusetts

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 548 - 549
Copyright
© 2005 Microscopy Society of America