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High Resolution Imaging of Dislocations Using Weak Beam Dark Field STEM

Published online by Cambridge University Press:  30 July 2020

Jiashi Miao
Jiashi Miao*
Affiliation:
Ohio State University, Columbus, Ohio, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1220 - 1222
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Copyright
Copyright © Microscopy Society of America 2020

References

Cockayne, D.J.H., Ray, I. L.F. and Whelan, M. J., Philosophical Magazine A 20 (1969), p.1265.10.1080/14786436908228210CrossRefGoogle Scholar
Miao, J., Singh, S., Tessmer, J., Shih, M., Ghazisaeidi, M., De Graef, M. and Mills, M.J., Microscopy and Microanalysis 24 (2018), p.2202.Google Scholar
De Graef, M., Microscopy and Microanalysis 16 (2010), p.246.10.1017/S1431927610054504CrossRefGoogle Scholar
The author is grateful to Prof. M. De Graef (CMU) and Prof. M.J. Mills (OSU) for helpful discussions.Google Scholar