Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-24T14:50:37.100Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Imaging and X-Ray Microanalysis with STEM in the FE-SEM

Published online by Cambridge University Press:  23 November 2012

R. Gauvin ,
P. Michaud ,
N. Brodusch  and
M.L. Trudeau
R. Gauvin
Affiliation:
Materials Engineering, McGill University, Montreal, Quebec, Canada
P. Michaud
Affiliation:
Materials Engineering, McGill University, Montreal, Quebec, Canada
N. Brodusch
Affiliation:
Materials Engineering, McGill University, Montreal, Quebec, Canada
M.L. Trudeau
Affiliation:
Institut de Recherche d’Hydro-Québec, Varennes, Quebec, Canada
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 390 - 391
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)