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High Resolution Imaging and X-Ray Microanalysis at High Count Rate: The Supreme Achievement in Materials Characterization

Published online by Cambridge University Press:  09 October 2013

R. Gauvin ,
D.C. Joy ,
N. Brodusch ,
H. Demers  and
P. Woo
R. Gauvin
Affiliation:
D.C. Joy
Affiliation:
N. Brodusch
Affiliation:
H. Demers
Affiliation:
P. Woo
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 360 - 361
Copyright
Copyright © Microscopy Society of America 2013