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High Resolution, High Throughput Electron Tomography Reconstruction

Published online by Cambridge University Press:  01 August 2005

R H M Schoenmakers ,
R A Perquin ,
T F Fliervoet  and
W Voorhout
R H M Schoenmakers
Affiliation:
FEI Company, The Netherlands
R A Perquin
Affiliation:
FEI Company, The Netherlands
T F Fliervoet
Affiliation:
FEI Company, The Netherlands
W Voorhout
Affiliation:
FEI Company, The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 312 - 313
Copyright
© 2005 Microscopy Society of America