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High Precision STEM Imaging by Non-Rigid Alignment and Averaging of a Series of Short Exposures

Published online by Cambridge University Press:  23 November 2012

B. Berkels ,
R. Sharpley ,
P. Binev ,
A. Yankovich ,
F. Shi ,
P. Voyles  and
W. Dahmen
B. Berkels
Affiliation:
Interdisciplinary Mathematics Institute, University of South Carolina, Columbia, SC
R. Sharpley
Affiliation:
Interdisciplinary Mathematics Institute, University of South Carolina, Columbia, SC
P. Binev
Affiliation:
Interdisciplinary Mathematics Institute, University of South Carolina, Columbia, SC
A. Yankovich
Affiliation:
University of Wisconsin, Madison, WI
F. Shi
Affiliation:
University of Wisconsin, Madison, WI
P. Voyles
Affiliation:
University of Wisconsin, Madison, WI
W. Dahmen
Affiliation:
RWTH Aachen, Aachen, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 300 - 301
Copyright
Copyright © Microscopy Society of America 2012

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