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High Precision Multiple Kev X-Ray Analysis: Tests of Ionization Cross Sections and Monte Carlo Algorithms

Published online by Cambridge University Press:  02 July 2020

John T. Armstrong ,
D. E. Newbury  and
P. K. Carpenter
John T. Armstrong
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899
D. E. Newbury
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899
P. K. Carpenter
Affiliation:
Division of Geological and Planetary Sciences, California Insitute of Technology, Pasadena, CA, 91125
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Extract

Determination of the variation of absolute and relative electron-excited x-ray production rates as a function of electron beam energy and sample atomic number is necessary for calculation of the "stopping power" atomic number correction and the relative amount of characteristic fluorescence and for development of “standardless” and Monte Carlo algorithms for quantitative x-ray analysis. Critical to the calculation of x-ray production rates is an accurate expression for the inner shell electron ionization cross section. A large number of expressions have been proposed for the relative x-ray production rates (used in the fluorescence correction)1 and for the ionization cross section used in the atomic number correction, and these yield quite different results. In order to evaluate which expressions gave the most accurate results when applied to quantitative x-ray emission measurements, we performed a series of high precision measurements of x-ray intensities as a function of electron beam accelerating potential for a series of pure element and simple oxide, phosphide, sulfide, and chloride standards for 65 elements ranging in Z from C to U

Type
Quantitative Biological and Materials Microanalysis by Electrons and X-Rays
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 887 - 888
Copyright
Copyright © Microscopy Society of America 1997

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References

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