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High Performance Remote Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Daniel E. Huber ,
Jonathan Orsborn ,
Frank Scheltens ,
Dave W. McComb  and
Hamish L. Fraser
Daniel E. Huber
Affiliation:
Center for Electron Microscopy and Analysis, Materials Science and Engineering, The Ohio State University, Columbus, OH, U.S.A.
Jonathan Orsborn
Affiliation:
Center for Electron Microscopy and Analysis, Materials Science and Engineering, The Ohio State University, Columbus, OH, U.S.A.
Frank Scheltens
Affiliation:
Center for Electron Microscopy and Analysis, Materials Science and Engineering, The Ohio State University, Columbus, OH, U.S.A.
Dave W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, Materials Science and Engineering, The Ohio State University, Columbus, OH, U.S.A.
Hamish L. Fraser
Affiliation:
Center for Electron Microscopy and Analysis, Materials Science and Engineering, The Ohio State University, Columbus, OH, U.S.A.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 177 - 178
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Zaluzec, N.J., Teleconference Mag 17 (1998.Google Scholar
[2] Fan, G.Y., et al., Ultramicroscopy 52 (1993). p. 499–503.Google Scholar
[3] Furuya, K., et al., Microscopy & Microanalysis 11 (2005). p. 68–69.Google Scholar
[4] Brown, G.M., et al., Microcopy & Microanalysis 15 (2009). p. 1102–1103.Google Scholar
[5] Mansfield, J.F., et al., Microscopy & Microanalysis 6 (2000). p. 31–41.Google Scholar
[6] Mansfield, J.F., Microscopy & Microanalysis 14 (2008). p. 876–877.CrossRefGoogle Scholar
[7] Isabell, T.C., et al., Microscopy & Microanalysis 14 (2008). p. 872–873.Google Scholar
[8] Isabell, T.C., et al., Microscopy & Microanalysis 17 (2011). p. 868–869.Google Scholar