Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-12-01T01:32:54.522Z Has data issue: false hasContentIssue false

High Performance Hyperspectral Imager for Microimaging

Published online by Cambridge University Press:  02 July 2020

Henryk Malak
Affiliation:
Microcosm Inc., 9140 Guilford Rd. , Columbia, MD, 21046, http://www.microcosm.com/
Petr Herman
Affiliation:
Center for Fluorescence Spectroscopy, University of Maryland at Baltimore, MD, 21201
Wayne Moore
Affiliation:
Microcosm Inc., 9140 Guilford Rd. , Columbia, MD, 21046, http://www.microcosm.com/
Jaroslav Vecer
Affiliation:
Institute of Physics, Charles University, Prague, Czech Republic.
Get access

Abstract

A high performance hyperspectral imager with high light throughput suitable for microscopy and analytical imaging was built and tested. The imager utilizes phenomenon of optical activity. The new technique provides a continuous spectral range of several hundreds of nanometers starting in deep UV. Similar spectral range starting in the near IR is also achievable.

A performance of a low cost implementation of the new technology is presented. The imager has a form of a microscope adaptor, which is inserted between the microscope and a low-cost 8-bit CCD camera. The resulting instrument is simple, robust, and highly compact. The imager module is placed in-line to the microscope imaging system and does not introduce observable image aberrations. Advantageously, the imager is transparent to conventional imaging operations, thus with the imager in-place there is no need for reconfiguration of the microscope to switch between conventional and hyperspectral video/digital imaging modes.

The presented spectral imager answers the need for a practical, sensitive, compact, and affordable imaging spectrometer. The instrument is well suited for a broad range of applications requiring rapid parallel acquisition of highly resolved concurrent spatial and spectral information such as high throughput screening, biochip analysis, remote sensing or nondestructive semiconductor testing.

Type
Video and Digital Imaging Microscopy: a Symposium Honoring Dr. Shinya Inoue (Organized by E. Salmon)
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Herman, P., Vecer, J., “Method and device for spectral analysis of light”, Czech patent 284282, 1998Google Scholar