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High Efficiency Chemical State Surface Analysis Imaging with XPS

Published online by Cambridge University Press:  23 September 2015

Sankar Raman ,
John F. Moulder  and
John S. Hammond
Sankar Raman
Affiliation:
Physical Electronics USA, Chanhassen, Minnesota, USA
John F. Moulder
Affiliation:
Physical Electronics USA, Chanhassen, Minnesota, USA
John S. Hammond
Affiliation:
Physical Electronics USA, Chanhassen, Minnesota, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1183 - 1184
Copyright
Copyright © Microscopy Society of America 2015