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High angular intensity gas field ion source with single atom tip

Published online by Cambridge University Press:  23 November 2012

H. Moritani ,
S. Matsubara  and
T. Hashizume
H. Moritani
Affiliation:
Hitachi High-Technologies Corporation, Ibaraki, Japan
S. Matsubara
Affiliation:
Hitachi Ltd, Tokyo, Japan
T. Hashizume
Affiliation:
Hitachi Ltd, Saitama, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 804 - 805
Copyright
Copyright © Microscopy Society of America 2012

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