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Helios G4: Pushing the Limits of TEM Sample Preparation and STEM Resolution

Published online by Cambridge University Press:  25 July 2016

Tomas Vystavel
Affiliation:
FEI Company, Vlastimila Pecha 12, Brno, Czech Republic
Lubomir Tuma
Affiliation:
FEI Company, Vlastimila Pecha 12, Brno, Czech Republic
Jan Skalicky
Affiliation:
FEI Company, Vlastimila Pecha 12, Brno, Czech Republic
Richard Young
Affiliation:
FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, OR, USA

Abstract

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Abstract
Copyright
© Microscopy Society of America 2016