Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-28T08:42:35.405Z Has data issue: false hasContentIssue false
  • English
  • Français

Hardware Engineering for an APT in a TEM Objective Lens

Published online by Cambridge University Press:  30 July 2020

Brian Gorman
Brian Gorman*
Affiliation:
Colorado School of Mines, Golden, Colorado, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2614 - 2615
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Bas, P., Bostel, A., Deconihout, B., Blavette, D., Applied Surface Science, 87–88, 298–304 (1995).10.1016/0169-4332(94)00561-3CrossRefGoogle Scholar
Diercks, D. R., Gorman, B. P., Ultramicroscopy 195, 32 (2018).10.1016/j.ultramic.2018.08.019CrossRefGoogle Scholar
Kirchhofer, R., Diercks, D. R., Gorman, B. P., Review of Scientific Instruments, 89, 053706 (2018).10.1063/1.4999484CrossRefGoogle Scholar
Kelly, T., Miller, M., Rajan, K., Ringer, S., Borisevich, A., Dellby, N., Krivanek, O., Microscopy and Microanalysis, 17(S2), 708–709 (2011).10.1017/S1431927611004417CrossRefGoogle Scholar
Gorman, B. P., US Patent #16/384,427, April 16, 2019.Google Scholar