Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T08:15:27.082Z Has data issue: false hasContentIssue false
  • English
  • Français

Hard X-ray In-situ Full-field Microscopy for Material Science Applications.

Published online by Cambridge University Press:  10 August 2018

Irina Snigireva ,
Ken Vidar Falch ,
Daniele Casari ,
Marco Di Michiel ,
Carsten Detlefs ,
Ragnvald Mathiesen  and
Anatoly Snigirev
Irina Snigireva*
Affiliation:
European Synchrotron Radiation Facility, 38000Grenoble, France
Ken Vidar Falch
Affiliation:
Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway
Daniele Casari
Affiliation:
Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway
Marco Di Michiel
Affiliation:
European Synchrotron Radiation Facility, 38000Grenoble, France
Carsten Detlefs
Affiliation:
European Synchrotron Radiation Facility, 38000Grenoble, France
Ragnvald Mathiesen
Affiliation:
Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway
Anatoly Snigirev
Affiliation:
Immanuel Kant Baltic Federal University, 238300Kaliningrad, Russia
*
* Corresponding author, email: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 552 - 553
Copyright
© Microscopy Society of America 2018 

References

[1] Snigirev, A., Kohn, V., Snigireva, I. Lengeler, B. Nature 384 1996 49–51.Google Scholar
[2] Kohn, V., Snigireva, I. Snigirev, A. Opt. Comm. 216 2003 247–260.Google Scholar
[3] Bosak, A., Snigireva, I., Napolskii, K. Snigirev, A. Adv. Mater. 22 2010 3256–3259.Google Scholar
[4] Byelov, D., et al, RSC Advances 3 2013 15670.Google Scholar
[5] Falch, K. V., et al, J. Mater Sci. 52 2017 3497–3507.Google Scholar
[6] Falch, K. V., et al, Appl. Phys. Lett. 109 2016 054103.Google Scholar
[7] Falch, K. V., et al, Ultramicroscopy 184 2018 267–273.Google Scholar