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Growth Mechanism of Ag Nanocrystal Supercrystals

Published online by Cambridge University Press:  02 July 2020

S.A. Harfenist ,
Z.L. Wang ,
I. Vezmar ,
M.M. Alvarez  and
R.L. Whetten
S.A. Harfenist
Affiliation:
School of Physics, Georgia Institute of Technology, Atlanta, Ga. 30332-0430
Z.L. Wang
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Ga. 30332
I. Vezmar
Affiliation:
School of Physics, Georgia Institute of Technology, Atlanta, Ga. 30332-0430
M.M. Alvarez
Affiliation:
Schools of Physics, Chemistry and Microelectronics Research Center, Georgia Institute of Technology, Adanta, Ga.30332-0430
R.L. Whetten
Affiliation:
Schools of Physics, Chemistry and Microelectronics Research Center, Georgia Institute of Technology, Adanta, Ga.30332-0430
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Extract

Of recent interest in the science of nano-scale materials is the production and characterization of substances composed of ordered lattices of up to millions of identical nanometer scale particles. Silver nanocrystals of ∼ 4.5 nm diameter passivated with dodecanthiol surfactant were produced in the aerosol phase. Characterization of the individual particles and the subsequent supercrystals (SXs) resulting from their periodic packing was brought about using Mass Spectrometry, Transmission Electron Microscopy (TEM)/Electron Diffraction (ED), Scanning Electron Microscopy and Atomic Force Microscopy (AFM). It was determined that the micrometer and greater sized faceted SXs exhibited an hexagonal-close-packed (HCP) superstructure (fig.l) resulting in triangular shapes bounded by ﹛1100﹜ facets (fig. la); their platlet-like nature (∼20 nanocrystal layers thick) owing to their particular growth pattern. Knowledge of the growth mechanism is important to production of these materials on a macroscopic scale. Here we report a proposed growth model for these supercrystals.

Type
Nanophase and Amorphous Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 732 - 733
Copyright
Copyright © Microscopy Society of America

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References

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