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Grain Size Determination and Grain Boundary Characterization of Nanocrystalline Thin Films from Conical Dark Field Imaging

Published online by Cambridge University Press:  01 August 2010

A Darbal ,
K Barmak ,
T Nuhfer ,
T Sun  and
KR Coffey
A Darbal
Affiliation:
Carnegie Mellon University
K Barmak
Affiliation:
Carnegie Mellon University
T Nuhfer
Affiliation:
Carnegie Mellon University
T Sun
Affiliation:
University of Central Florida
KR Coffey
Affiliation:
University of Central Florida

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1276 - 1277
Copyright
Copyright © Microscopy Society of America 2010