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Grain Boundaries across Length Scales; Correlating SEM, Aberration-Corrected TEM Orientation Imaging and Nanospectroscopy

Published online by Cambridge University Press:  23 September 2015

W. J. Bowman ,
A. Darbal ,
M. Kelly ,
G.S. Rohrer ,
C.H. Hernandez ,
K. McGuinness  and
P.A. Crozier
W. J. Bowman
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe Arizona 85287-6106, USA
A. Darbal
Affiliation:
AppFive LLC, Tempe, Arizona, USA
M. Kelly
Affiliation:
Materials Research Science and Engineering Center, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213, USA
G.S. Rohrer
Affiliation:
Materials Research Science and Engineering Center, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213, USA
C.H. Hernandez
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe Arizona 85287-6106, USA
K. McGuinness
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe Arizona 85287-6106, USA
P.A. Crozier
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe Arizona 85287-6106, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 491 - 492
Copyright
Copyright © Microscopy Society of America 2015 

References

References and acknowledgements

[1] Helmick, L., et al., Int. J. Appl. Ceram. Technol. 8(5), 1218–1228 (2011)Google Scholar
[2] Pennycook, S.J. & Nellist, P.D., Scanning Transmission Electron Microscopy. Springer.CrossRefGoogle Scholar
[3] Darbal, A.D., et al., Microsc. Microanal. 19, 111–119 (2013)Google Scholar
[4] C.A.H. and K.M. wish to thank the Fulton Undergraduate Research Initiative at ASU for generous financial support throughout this work. W.J.B. would like to acknowledge the National Science Foundation's Graduate Research Fellowship (DGE-1211230) for continued financial support. Finally, we gratefully acknowledge support of NSF grant DMR-1308085 and ASU's John M. Cowley Center for High Resolution Electron Microscopy.Google Scholar