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GPU-Based Defect Image Simulations using the Scattering Matrix Formalism

Published online by Cambridge University Press:  23 September 2015

Saransh Singh  and
Marc De Graef
Saransh Singh
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2213 - 2214
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Marc De Graef in "Introduction to Conventional Transmission Electron Microscopy" (2003, Cambridge University Press, New York, p. 310. p. 462.Google Scholar
[2] Pennington, R.S., Wang, F. & Koch, C.T., Ultramicroscopy 141, 32–37 (2014).CrossRefGoogle Scholar
[3] Phillips, P.J., Mills, M.J. & De Graef, M., Ultramicroscopy 111, 1483–1487 (2011).CrossRefGoogle Scholar
[4] Callahan, P.G. & De Graef, M., Microscopy and Microanalysis 19, 1255–1265 (2013).CrossRefGoogle Scholar
[5] Research supported by the Air Force Office of Scientific Research. MURI contract # FA9550-, 12–1-0458.Google Scholar