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Fundamental Constants for Quantitative X-ray Microanalysis

Published online by Cambridge University Press:  02 February 2002

David C. Joy
David C. Joy*
Affiliation:
Science and Engineering Research Facility, University of Tennessee, 1414 Circle Drive, Room 232, Knoxville, TN 37996 Oak Ridge National Laboratory, Oak Ridge, TN 37831
*
*Corresponding author, at Science and Engineering Research Facility, University of Tennessee, 1414 Circle Drive, Room 232, Knoxville, TN 37996-0810.
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Abstract

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the quality and quantity of data available is poor, and that there are major gaps remaining to be filled.

Keywords

X-ray microanalysiselectron stopping powerionization cross-sectionfluorescent yieldbackscatter yield
Type
Research Article
Information
Microscopy and Microanalysis , Volume 7 , Issue 2 , March 2001 , pp. 159 - 167
Copyright
Copyright © Microscopy Society of America 2001

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