Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-29T09:06:58.662Z Has data issue: false hasContentIssue false
  • English
  • Français

FT-IR Spectroscopic Imaging in the Infrared “Fingerprint”Region Using an Mct Array Detector

Published online by Cambridge University Press:  02 July 2020

R. A. Crocombe ,
N. Wright ,
D.L. Drapcho ,
W.J. McCarthy ,
P. Bhandare  and
E.J. Jiang
R. A. Crocombe
Affiliation:
Bio-Rad Digilab Division, 237 Putnam Avenue, Cambridge, MA02139, U.S.A.
N. Wright
Affiliation:
Bio-Rad Digilab Division, 237 Putnam Avenue, Cambridge, MA02139, U.S.A.
D.L. Drapcho
Affiliation:
Bio-Rad Digilab Division, 237 Putnam Avenue, Cambridge, MA02139, U.S.A.
W.J. McCarthy
Affiliation:
Bio-Rad Digilab Division, 237 Putnam Avenue, Cambridge, MA02139, U.S.A.
P. Bhandare
Affiliation:
Bio-Rad Digilab Division, 237 Putnam Avenue, Cambridge, MA02139, U.S.A.
E.J. Jiang
Affiliation:
Bio-Rad Digilab Division, 237 Putnam Avenue, Cambridge, MA02139, U.S.A.
Get access

Extract

A new infrared spectroscopic imaging technique has been described, combining step-scan Fourier transform (FT) Michelson interferometry with indium antimonide (InSb) focal-plane array (FPA) image detection [1-3], for use in the range 3950-1975 cm−1. The coupling of such detector to an interferometer provides an optimized method for infrared spectroscopic imaging by simultaneously realizing both a multiplex and multichannel advantage. Specifically, the multiple detector elements enable spectra at all pixels to be collected simultaneously, while the interferometer allows all the spectral frequencies to be measured concurrently. This technique can rapidly generate very high quality, chemically specific images from a wide variety of samples. Preliminary results from the use of a mid-infrared liquid-helium-cooled arsenic-doped-silicon array have also been reported recently [4]. Focal-plane arrays using mercury-cadmium-telluride (MCT) are now commercially available, giving access to the range 3950-800 cm−1, and greatly broadening the applicability of this technique [5].

FT-IR microscopy does not require exotic sample preparation -- samples can be examined in transmission and reflectance, do not need to be stained or coated, and a vacuum is not required.

Type
Optical Microanalysis
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 863 - 864
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Neil Lewis, E., J. Treado, Patrick, C. Reeder, Robert, M. Story, Gloria, E. Dowrey, Anthony, Curtis, Marcott and W. Levin, Ira, Anal. Chem., 67, 3377–3381 (1995).10.1021/ac00115a003CrossRefGoogle Scholar
2.Neil Lewis, E., M. Gorbach, Alexander, Curtis, Marcott and W. Levin, Ira, Appl. Spectrosc, 50, 263–269 (1996).10.1366/0003702963906618CrossRefGoogle Scholar
3.Lewis, E.N., Levin, I.W. and Crocombe, R.A., Mikrochimica Acta, In press, 1997.Google Scholar
4.Neil Lewis, E., H. Kidder, Linda, F. Arens, John, C. Peck, Michael and W. Levin, Ira, AIRS II, Durham, NC, June 1996.Google Scholar
5. MCT Focal-Plane Array Detection for Mid-Infrared Fourier Transform Spectroscopic Imaging, Kidder, L.H., Levin, I.W., Lewis, E.N., Kleiman, V.D. and Heilweil, E.J., Optics Letters, In press, 1997.Google Scholar