Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-02T18:55:36.440Z Has data issue: false hasContentIssue false

From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology

Published online by Cambridge University Press:  04 August 2017

Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Chris-Kriton Skylaris
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Aakash Varambhia
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Jolyon Aarons
Affiliation:
School of Chemistry, University of Southampton, Highfield, UK.
Katherine E. MacArthur
Affiliation:
Ernst Ruska Center, Forschungszentrum Julich GmbH, Julich, Germany.
Dogan Ozkaya
Affiliation:
Johnson Matthey Technology Centre, Sonning Common, Reading, UK.
Misbah Sarwar
Affiliation:
Johnson Matthey Technology Centre, Sonning Common, Reading, UK.

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Jones, L., et al, Nano Lett. 14:11 2014). p. 6336.CrossRefGoogle Scholar
[2] Jones, L. IOP Conf. Ser. Mater. Sci. Eng. 109:1 2016). p. 12008.CrossRefGoogle Scholar
[3] Jones, L., et al, Adv. Struct. Chem. Imaging 1:1 2015). p. 8.CrossRefGoogle Scholar
[4] De Backer, A., et al, Ultramicroscopy 171 2016). p. 104.CrossRefGoogle Scholar
[5] De wael, A., et al, Ultramicroscopy 41:1 2017). p. 81.Google Scholar
[6] The research was supported by the European Union under Grant Agreement 312483 - ESTEEM2 and EPSRC grant code, EP/K040375/1, for the 'South of England Analytical Electron Microscope'.Google Scholar