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The f-ratio Quantification Method for X-ray Microanalysis with a Field Emission SEM Applied to Multi-Elements Specimen

Published online by Cambridge University Press:  04 August 2017

Chaoyi Teng ,
Hendrix Demers ,
Nicolas Brodusch  and
Raynald Gauvin
Chaoyi Teng
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1046 - 1047
Copyright
© Microscopy Society of America 2017 

References

[1] Horny, P. Ph.D thesis, in department of Mining, Metals and Materials Engineering, McGill University (2006)..Google Scholar
[2] Horny, P., et al, Microscopy and Microanalysis 16 2010). p. 821.CrossRefGoogle Scholar
[3] Le Berre, J.F., et al, Final Report Submitted to Carl D. Fuerst 2007.Google Scholar
[4] Gauvin, R. & Michaud, P Microscopy and Microanalysis 15(2 2009). p. 488.CrossRefGoogle Scholar