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Focused Ion Beam Sample Preparation for High Temperature In-situ Transmission Electron Microscopy Experiments: Use Carbon for Now

Published online by Cambridge University Press:  30 July 2020

Jules Gardener ,
Austin Akey ,
Daan Hein Alsem  and
David Bell
Jules Gardener
Affiliation:
Harvard University Center for Nanoscale Systems, Cambridge, Massachusetts, United States
Austin Akey
Affiliation:
Harvard University Center for Nanoscale Systems, Cambridge, Massachusetts, United States
Daan Hein Alsem
Affiliation:
Hummingbird Scientific, Lacey, Washington, United States
David Bell
Affiliation:
Harvard University, Cambridge, Massachusetts, United States

Abstract

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Type
In Situ TEM at the Extremes - Extreme Temperature and Biasing
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3202 - 3203
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Copyright
Copyright © Microscopy Society of America 2020

References

Flathmann, C., Spende, H., Meyer, T., Peretzki, P. and Seibt, M. Phys. Status Solidi A (2019) 216, 1900308Google Scholar
Staubinger, R., Beyer, A. and Volz, K. Microsc. Microanal. (2016) 22, 515-51910.1017/S1431927616000593CrossRefGoogle Scholar
Fawey, M. H., Chakravadhanula, V. S. K., Reddy, M. A., Rongeat, C., Scherer, T., Hahn, H., Fichtner, M. and Kubel, C. Microsc. Res. Tech. (2016) 79, 615-62410.1002/jemt.22675CrossRefGoogle Scholar