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Focused Ion Beam Prepared Cross-Sectional Transmission Electron Microscopy Preparation On CaGe2 On Ge(111) Grown By Molecular Beam Epitaxy

Published online by Cambridge University Press:  04 August 2017

Robert E.A. Williams ,
Jinsong Xu ,
Amanda Hanks ,
Adam Ahmed ,
Igor V. Pinchuk ,
Dave McComb ,
Roland Kawakami  and
Jyoti Katoch
Robert E.A. Williams
Affiliation:
Center for Electron Microscopy and Microanalysis(CEMAS), The Ohio State University, Columbus, Ohio 43212, United States
Jinsong Xu
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Amanda Hanks
Affiliation:
Center for Electron Microscopy and Microanalysis(CEMAS), The Ohio State University, Columbus, Ohio 43212, United States
Adam Ahmed
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Igor V. Pinchuk
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Dave McComb
Affiliation:
Center for Electron Microscopy and Microanalysis(CEMAS), The Ohio State University, Columbus, Ohio 43212, United States
Roland Kawakami
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States
Jyoti Katoch
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210-1340, United States

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 290 - 291
Copyright
© Microscopy Society of America 2017 

References

[1] Kato, Y., Myers, R. C., Gossard, A. C. & Awschalom, D. D. Nature 427(6969), 50 2004.CrossRefGoogle Scholar
[2] Kato, Y. K., Myers, R. C., Gossard, A. C. & Awschalom, D. D. Science 306(5703), 1910 2004.CrossRefGoogle Scholar
[3] Ophus, Colin, Ciston, Jim & Nelson, Chris T. Ultramicroscopy 162 2016 1–9.Google Scholar