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Focused Ion Beam Micromachining Enables Novel Optics for X-ray Microscopy

Published online by Cambridge University Press:  23 September 2015

Kahraman Keskinbora ,
Umut T. Sanli ,
Corinne Grevent ,
Michael Hirscher  and
Gisela Schiitz
Kahraman Keskinbora
Affiliation:
Max Planck Institute for Intelligent Systems, Dept. Modern Magnetic Systems, Stuttgart, Germany
Umut T. Sanli
Affiliation:
Max Planck Institute for Intelligent Systems, Dept. Modern Magnetic Systems, Stuttgart, Germany
Corinne Grevent
Affiliation:
Max Planck Institute for Intelligent Systems, Dept. Modern Magnetic Systems, Stuttgart, Germany
Michael Hirscher
Affiliation:
Max Planck Institute for Intelligent Systems, Dept. Modern Magnetic Systems, Stuttgart, Germany
Gisela Schiitz
Affiliation:
Max Planck Institute for Intelligent Systems, Dept. Modern Magnetic Systems, Stuttgart, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1983 - 1984
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[6] Keskinbora, K., Robisch, A.-L., Mayer, M., et al., Optics Express 22 (2014) 18440–18453.CrossRefGoogle Scholar