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Focused Ion Beam (FIB) and Energy Dispersive X-Ray (EDX) Analysis in Adhesive Dentistry

Published online by Cambridge University Press:  25 July 2016

Lolita Rotkina ,
Christoph Zbaeren ,
Joannis Katsoulis ,
Tomohiro Takagaki  and
Markus Blatz
Lolita Rotkina
Affiliation:
Ioffe Physical-Technical Institute of Russian Academy of Sciences, St.Petersburg, Russia University of Pennsylvania, School of Dental Medicine, Philadelphia, US
Christoph Zbaeren
Affiliation:
University of Pennsylvania, School of Dental Medicine, Philadelphia, US
Joannis Katsoulis
Affiliation:
University of Pennsylvania, School of Dental Medicine, Philadelphia, US School of Dental Medicine, University of Bern, Bern, Switzerland
Tomohiro Takagaki
Affiliation:
Tokyo Medical and Dental University, Tokyo, Japan
Markus Blatz
Affiliation:
University of Pennsylvania, School of Dental Medicine, Philadelphia, US

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1872 - 1873
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Blatz, Markus B., et al., Quintessence Int (2007) 38, 745–753.Google Scholar
[2] Van Meerbeek, B, et al, Dent Mater (1995 Mar) 11(2), 87–92.Google Scholar
[3] Giannuzzi, Lucille A., et al., Journal of Oral and Maxillofacial Surgery Vol ume 65(Issue 4), 737–747.Google Scholar
[4] Inokoshi, M., et al, J Dent Res 93(4), 329–334.Google Scholar
[5] Asuka, , et al, Dental Materials Journal (2016) 35(1), 29–36.Google Scholar
[6] We acknowledge the access to the major instruments used for the experimental work it this study: FEI Strata DB FIB and FEI Quanta 600 ESEM with BSED at the Nanoscale Characterization Facility of the University of Pennsylvania, and FEI Quanta 400 ESEM with an Oxford INCA EDS in the CMIRT at West Chester University. Special acknowledgement goes to Dr. Fred Monson for his advising and encouragement in many ways.Google Scholar