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Focused Ion Beam (FIB) and Energy Dispersive X-Ray (EDX) Analysis in Adhesive Dentistry
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1872 - 1873
- Copyright
- © Microscopy Society of America 2016
References
References:
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Giannuzzi, Lucille A., et al.,
Journal of Oral and Maxillofacial Surgery
Vol ume 65(Issue 4), 737–747.Google Scholar
[6] We acknowledge the access to the major instruments used for the experimental work it this study: FEI Strata DB FIB and FEI Quanta 600 ESEM with BSED at the Nanoscale Characterization Facility of the University of Pennsylvania, and FEI Quanta 400 ESEM with an Oxford INCA EDS in the CMIRT at West Chester University. Special acknowledgement goes to Dr. Fred Monson for his advising and encouragement in many ways.Google Scholar
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