No CrossRef data available.
Article contents
Focused Ion Beam Characterization of Low Melting Point Metals at Cryogenic Temperatures
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
de Morais, LD, Chevalliez, S and Mouleres, S, Microelec. Reliability 54 (2014), p. 1802.10.1016/j.microrel.2014.08.004CrossRefGoogle Scholar
Nelson, RS, Philosophical Magazine 11(110) (1965), p. 291.10.1080/14786436508221857CrossRefGoogle Scholar
This work is supported by the Laboratory Directed Research and Development program at Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.Google Scholar
You have
Access