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Field Emission and Electron Microscopy

Published online by Cambridge University Press:  07 August 2002

Christopher John Edgcombe  and
Ugo Valdrè
Christopher John Edgcombe
Affiliation:
Cavendish Laboratory, Department of Physics, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK Granta Electronics Ltd., 25 St. Peter’s Road, Coton CB3 7PR, UK
Ugo Valdrè*
Affiliation:
Cavendish Laboratory, Department of Physics, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK Instituto Nazionale per la Fisica della Materia, and University Physics Department, University of Bologna, via Irnerio 46, 40126 Bologna, Italy
*
*Corresponding author, at Instituto Nazionale per la Fisica della Materia, and University Physics Department, University of Bologna, via Irnerio 46, 40126 Bologna, Italy.
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Abstract

An overview and new results are presented of the investigations carried out in the last 5 years on nano-sized tips by means of electron microscopy, an electron optical bench, and computation. Tungsten and, in particular, carbon nano-tips prepared by carbon contamination in a scanning electron microscope, were studied for applications as field-emission electron sources. Several features of their use are described and the results concerning the determination of some of their basic properties are reported.

Keywords

work functionfield emissionnano-tipselectron gunsfinite element analysisspecimen holderscarbon contaminationtransmission electron microscopyscanning electron microscopyscanning transmission electron microscopy
Type
Research Article
Information
Microscopy and Microanalysis , Volume 6 , Issue 4 , July 2000 , pp. 380 - 387
Copyright
Copyright © Microscopy Society of America 2000

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