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FIB-TEM Characterization Of Surface And Sub-Surface Defects Introduced Into Lithium Niobate By A Femtosecond Laser

Published online by Cambridge University Press:  24 July 2003

E.A. Stach ,
V.R. Radmilovic ,
D. Deshpande ,
A. Malshe ,
D. Alexander  and
D. Doerr
E.A. Stach
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
V.R. Radmilovic
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
D. Deshpande
Affiliation:
SERC for Durable Micro and Nano Systems, Department of Mechanical Engineering, University of Arkansas, Fayetteville, AR
A. Malshe
Affiliation:
SERC for Durable Micro and Nano Systems, Department of Mechanical Engineering, University of Arkansas, Fayetteville, AR
D. Alexander
Affiliation:
Center for Electro – Optics, University of Nebraska, Lincoln, NE
D. Doerr
Affiliation:
Center for Electro – Optics, University of Nebraska, Lincoln, NE

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 876 - 877
Copyright
Copyright © Microscopy Society of America 2003