Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-26T07:59:46.512Z Has data issue: false hasContentIssue false
  • English
  • Français

Fast Automatic Point Spread Function Deconvolution Using Edge Detection

Published online by Cambridge University Press:  22 July 2022

Zachary E. Russell ,
Mathieu Therezien ,
Tomas J. McIntee ,
Shane T. DiDona ,
Jeffrey J. Haggen  and
Edward L. Principe
Zachary E. Russell*
Affiliation:
Ion Innovations, Boone, NC, United States
Mathieu Therezien
Affiliation:
Ion Innovations, Boone, NC, United States
Tomas J. McIntee
Affiliation:
Ion Innovations, Boone, NC, United States
Shane T. DiDona
Affiliation:
Ion Innovations, Boone, NC, United States
Jeffrey J. Haggen
Affiliation:
Synchrotron Research Institute, Melbourne Beach, FL, United States
Edward L. Principe
Affiliation:
Synchrotron Research Institute, Melbourne Beach, FL, United States
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3076 - 3077
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Vanderlinde, WE and Caron, J, Blind Deconvolution of SEM Images, Conference Proceedings from the International Symposium for Testing and Failure Analysis (2007).CrossRefGoogle Scholar
Kandel, Y. et al. , Microscopy and Microanalysis 21 (2015), p. 699. doi:10.1017/S1431927615004298CrossRefGoogle Scholar
OpenCV, https://opencv.org (accessed February 24th, 2022).Google Scholar
Richardson, WH, Journal of the Optical Society of America 62 (1972), p. 55. doi:10.1364/JOSA.62.000055CrossRefGoogle Scholar
Lucy, LB, Astronomical Journal 79 (1974), p. 745. doi:10.1086/111605CrossRefGoogle Scholar
Landweber, L, American Journal of Mathematics 73 (1951), p. 615. doi:10.2307/2372313CrossRefGoogle Scholar
Tikhonov, AN, Doklady Akademii Nauk SSSR 39 (1943), p. 195.Google Scholar
Kandel, Y., “Determination of Current Density Distribution in an Electron Beam” (2015).Google Scholar
Funding in part from the NIST Awards SB1341-15-CN-0050, SB1341-16-SE-0203, SB1341-17-CN-0029; and the Sensors Directorate of Air Force Research Labs (AFRL/RYD) under Contract No. FA8650-17-F-1047.Google Scholar