Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-28T08:06:18.678Z Has data issue: false hasContentIssue false
  • English
  • Français

Extreme-Ultraviolet Vortices at a Free-Electron Laser

Published online by Cambridge University Press:  10 August 2018

Primož Rebernik Ribič ,
Benedikt Rösner ,
David Gauthier ,
Florian Döring ,
Claudio Masciovecchio ,
Emiliano Principi ,
Christian David  and
Giovanni De Ninno
Primož Rebernik Ribič
Affiliation:
Elettra-Sincrotrone Trieste, Strada Statale 14-km 163,5, 34149Basovizza, Trieste, Italy
Benedikt Rösner*
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
David Gauthier
Affiliation:
Elettra-Sincrotrone Trieste, Strada Statale 14-km 163,5, 34149Basovizza, Trieste, Italy
Florian Döring
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Claudio Masciovecchio
Affiliation:
Elettra-Sincrotrone Trieste, Strada Statale 14-km 163,5, 34149Basovizza, Trieste, Italy
Emiliano Principi
Affiliation:
Elettra-Sincrotrone Trieste, Strada Statale 14-km 163,5, 34149Basovizza, Trieste, Italy
Christian David
Affiliation:
Paul Scherrer Institut, 5232Villigen PSI, Switzerland
Giovanni De Ninno
Affiliation:
Elettra-Sincrotrone Trieste, Strada Statale 14-km 163,5, 34149Basovizza, Trieste, Italy Laboratory of Quantum Optics, University of Nova Gorica, 5001Nova Gorica, Slovenia
*
* Benedikt Rösner, [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 292 - 293
Copyright
© Microscopy Society of America 2018 

References

[1] Picon, A, Benseny, A, Mompart, J, et al, New J Phys 12 2010) p. 083053.CrossRefGoogle Scholar
[2] Watzel, J, Pavlyukh, Y, Schaffer, A, et al, Carbon 99 2016) p. 439.CrossRefGoogle Scholar
[3] Fujita, H Sato, M Phys Rev B 95 2017) p. 054421.CrossRefGoogle Scholar
[4] Vila-Comamala, J, Sakdinawat, A Guizar-Sicairos, M Opt Lett 39 2014) p. 5281.CrossRefGoogle Scholar
[5] Ribic, P R, Rosner, B, Gauthier, D, et al, Phys Rev X 7 2017) p. 031036.Google Scholar
[6] David, C, Gorelick, S, Rutishauser, S, et al, Sci Rep 1 2011) p. 57.CrossRefGoogle Scholar
[7] Vila-Comamala, J, Jefimovs, K, Raabe, J, et al, Microelectron Eng 85 2008) p. 1241.CrossRefGoogle Scholar
[8] Ribic, P R, Gauthier, D De Ninno, G Phys Rev Lett 112 2014) p. 203602.CrossRefGoogle Scholar
[9] Rosner, B, Doring, F, Ribic, P R, et al, Opt Express 25 2017) p. 30686.CrossRefGoogle Scholar