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Exploring Spatial Resolution in Electron Back-Scattered Diffraction Experiments via Monte Carlo Simulation

Published online by Cambridge University Press:  28 July 2005

S.X. Ren ,
E.A. Kenik ,
K.B. Alexander  and
A. Goyal
S.X. Ren
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Building 5500, MS 6376, P.O. Box 2008, Oak Ridge, TN 37831-6376
E.A. Kenik
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Building 5500, MS 6376, P.O. Box 2008, Oak Ridge, TN 37831-6376
K.B. Alexander
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Building 5500, MS 6376, P.O. Box 2008, Oak Ridge, TN 37831-6376
A. Goyal
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Building 5500, MS 6376, P.O. Box 2008, Oak Ridge, TN 37831-6376
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Abstract

A Monte Carlo model was used to simulate specimen-electron beam interactions relevant to electron back-scattered diffraction (EBSD). Electron trajectories were calculated for a variety of likely experimental conditions to examine the interaction volume of the incident electrons as well as that of the subset of incident electrons that emerge from the specimen, i.e., back-scattered electrons (BSEs). The spatial resolution of EBSD was investigated as functions of both materials properties, such as atomic number, atomic weight, and density, and experimental parameters, such as specimen thickness, tilt, and incident beam accelerating voltage. These simulations reveal that the achievable spatial resolution in EBSD is determined by these intrinsic and extrinsic parameters.

Keywords

Monte Carlo simulationback-scattered electrons (BSEs)spatial resolutionenergy distributionelectron back-scattered diffraction (EBSD)
Type
Research Article
Information
Microscopy and Microanalysis , Volume 4 , Issue 1 , February 1998 , pp. 15 - 22
Copyright
© 2005 Microscopy Society of America

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