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Exploring Low-dimensional Carbon Materials by High-resolution Electron and Scanned Probe Microscopy

Published online by Cambridge University Press:  23 September 2015

Jannik C. Meyer
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Jani Kotakoski
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Giacomo Argentero
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Clemens Mangier
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Bernhard Bayer
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Christian Kramberger-Kaplan
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Franz Eder
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Stefan Hummel
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria
Kenan Elibol
Affiliation:
University of Vienna, Physics department, Boltzmanngasse 5, 1090 Vienna, Austria

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Meyer, J. C., et al, Phys. Rev. Lett. 108 (2012), p 196102.Google Scholar
[2] Meyer, J. C., et al, Nature materials 10 (2011), p 209.Google Scholar
[3] Argentero, G., et al, Ultramicroscopy (in press 2014), (DOI:10.1016/j.ultramic.2014.11.031).Google Scholar
[4] Meyer, J. C., Kotakoski, J. & Mangler, C., Ultramicroscopy 145 (2014), p 13.Google Scholar
[5] Eder, F., et al, Nano Letters 13 (2013), p 1934.CrossRefGoogle Scholar
[6] The authors acknowledge funding from the European Research Council (ERC) Project No. 336453-PICOMAT, Austrian Science Fund (FWF) through Grant No. P25721-N20, M1481-N20, and I1283-N20.Google Scholar